Cataract and refractive surgeons rely on devices that allow for ultra precise imaging to measure corneal architecture and power. The GALILEI™ Dual Scheimpflug Analyzer, with its innovative technology, sets a higher standard for diagnosis, biometry and management of cataract and refractive surgery.

Dual Scheimpflug imaging

GALILEI captures slit images from opposite sides of the illuminated slit and averages the elevation data obtained from corresponding opposite slit images. This Dual Scheimpflug imaging technique improves the detection of the posterior corneal surface and provides for outstanding accuracy in pachymetry across the entire cornea – even when the camera is decentered due to eye movement.

Merging of Placido and Scheimpflug data

Although the resolution of Scheimpflug images is high enough to deliver accurate profile data, it is insufficient to calculate central corneal power (curvature data) with acceptable accuracy. GALILEI overcomes this limitation by merging Placido and Scheimpflug data, acquired simultaneously by the two techniques, into a comprehensive single data set. This is essential for obtaining highest accuracy for both elevation and curvature data across the entire cornea.

Near/far fixation target

The GALILEI Dual Scheimpflug Analyzer features an adjustable near/far fixation target that allows the examination of the anterior chamber, crystalline lens and any intraocular lenses at different accommodation states.