The New Face of Precision Topography (2 MB)
Supplement to CRST; February 2009 issue. With contributions by Michael Woodcock MD, Jaime Aramberri MD, Douglas Koch MD, Mauro Zuppardo MD, Rajesh Khanna MD, and Carlos C. Arce MD

GALILEI Technology White Paper (465 KB)
White Paper explaining the technologies used in the GALILEI analyzer. Roberts C, Zueger B (2006).

Zuppardo: Dual Scheimpflug Imaging (93 KB)
Dual Scheimpflug Imaging Yields Accuracy for Refractive Planning, by Mauro Zuppardo, OD, PhD. Combination with Placido ring technology assures precise elevation and depth measurements with the GALILEI Analyzer. Cataract & Refractive Surgery Today Europe, March 2008, p 50-51.

GALILEI Posters presented at major conferences

ASCRS 2008: Custom Color Scales, by C. Arce

ASCRS 2008: Posterior Corneal Power in IOL Calculations, by M. Welkert et al.

ASCRS 2008: Double Scheimpflug and Placido Technology, by R. Kashiwabuchi

ASCRS 2008: Prediction of IOL Position Using the Galilei, by M. Shirayama